Materials Analysis
Nanocrystals of silicon (Scanning Electron Microscope) :
Automatical Detection of Nanocrystals of silicon
"Journal of Crystal Growth 209 (2000) 1004-1008 : Priority communication
Silicon quantum dot nucleation on Si3N4, SiO2 and SiOxNy
substrates for nanoelectronic devices" (T. Baron, F. Martin, P. Mur, C. Wyon, M. Dupuy)
Demonstration
Overlapping particles :
Automatical Detection of particles that overlap, analysing their convex hull.
Demonstration
3D Analysis of a concrete bloc (needs the 3D key).
Demonstration.
Other examples of 3D processes with Visilog
Analysis of a material deposit :
Analysis of a material deposit on a wafer edge.
Demonstration
Detection of vertical and horizontal lines with a length analysis.
Demonstration
Detection an analysis of dark objects.
Demonstration
Find the fibers orientation in different regions of the image.
Demonstration.
LASER spots analysis :
Find and analyse LASER spots.
Demonstration
Detection of the yellow pellets among the white pellets.
Demonstration
Find and analyse of stitch: porosity rate...
Demonstration
Pollution particles :
Find, analyse and classify of pollution particles.
Demonstration
Porcelain
structure analysis :
Analyse the porcelain structure by identifying inclusions and the bubbles.
Demonstration
Pollution deposit :
Calculation by polygonal approximation of pollution deposit characteristics
on a polymer.
Demonstration.
